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International Journal of Advanced Research in Computer and Communication Engineering A monthly Peer-reviewed & Refereed journal
ISSN Online 2278-1021ISSN Print 2319-5940Since 2012
IJARCCE adheres to the suggestive parameters outlined by the University Grants Commission (UGC) for peer-reviewed journals, upholding high standards of research quality, ethical publishing, and academic excellence.
← Back to VOLUME 2, ISSUE 7, JULY 2013

A Built-In Self Test By Enhanced Faults Coverage with Microcode Optimization for Embedded Memory

IMTHIAZUNNISA BEGUM M.TECH, SHAIK KHAYYUM, KORANI RAVINDER M.TECH,[PH.D] H.O.D, ECE Department, VIFCET, JNTU Hyderabad M.Tech Student, ECE Department VIFCET, JNTU Hyderabad Asst. Professor, ECE Department, VIFCET, JNTU Hyderabad

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[1] IMTHIAZUNNISA BEGUM M.TECH, SHAIK KHAYYUM, KORANI RAVINDER M.TECH,[PH.D] H.O.D, ECE Department, VIFCET, JNTU Hyderabad M.Tech Student, ECE Department VIFCET, JNTU Hyderabad Asst. Professor, ECE Department, VIFCET, JNTU Hyderabad, “A Built-In Self Test By Enhanced Faults Coverage with Microcode Optimization for Embedded Memory,” International Journal of Advanced Research in Computer and Communication Engineering (IJARCCE)