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A Built-In Self Test By Enhanced Faults Coverage with Microcode Optimization for Embedded Memory
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[1] IMTHIAZUNNISA BEGUM M.TECH, SHAIK KHAYYUM, KORANI RAVINDER M.TECH,[PH.D] H.O.D, ECE Department, VIFCET, JNTU Hyderabad M.Tech Student, ECE Department VIFCET, JNTU Hyderabad Asst. Professor, ECE Department, VIFCET, JNTU Hyderabad, âA Built-In Self Test By Enhanced Faults Coverage with Microcode Optimization for Embedded Memory,â International Journal of Advanced Research in Computer and Communication Engineering (IJARCCE)
